The XRD patterns compared in Figure 4 (for NiO thin films)

and Figure 5 (for NiO/TZO thin films) will also demonstrate that the TZO thin films can dominate the crystalline structure of NiO thin films. The uniformity and roughness of the 100 W-deposited NiO/125 W-deposited TZO heterojunction diode were better than those of the NiO/TZO heterojunction diodes with TZO thin films deposited at other powers (not shown here). Figure 1b shows the cross-section SEM image of the 100 W-deposited NiO/125 W-deposited TZO heterojunction diode; the Al electrode and the ITO substrate electrode are also observed in Figure 1b. Cross-sectional observations of all the NiO/TZO heterojunction diodes showed that NiO thin films deposited on different TZO thin films had the same

thickness of about 180 nm, which was achieved by controlling the deposition time. However, although the PX-478 chemical structure TZO thin films were deposited in the same amount of time, they had thicknesses of about 315, 350, 380, and 450 nm as the deposition power was changed from 75 W (not shown here) to 100 W (not shown here), 125 W, and 150 W (not shown here), respectively. Figure 4 XRD patterns of NiO thin films as a function of deposition power. (a) 75 W, (b) 100 W, (c) 125 W, and (d) 150 W. Figure 5 XRD patterns of NiO/TZO heterojunction diodes as a function of deposition power of TZO thin films. (a) 75 W, (b) 100 W, (c) 125 W, and (d) 150 W. Figure 4 shows the XRD patterns of the NiO thin films deposited as a function of deposition power. No matter what deposition power was used, the only this website (200) diffraction peak was observed in the NiO thin films, and the 100 W-deposited NiO thin films had the optimal crystallization. XRD patterns of the NiO/TZO heterojunction diodes for TZO

thin films deposited at different deposition powers are shown in Figure 5. All patterns exhibited the (002) and (004) diffraction peaks Oxymatrine of the ZnO (TZO) crystallization preferential orientation along the c-axis at diffraction angles (2θ) near 34.28° and 72.58°, with a hexagonal structure; no peak characteristic of TiO2 was found. The diffraction peak revealed that a 2θ value of 36.74° corresponded to the (111) plane of the NiO thin film with a cubic structure, which was different from the check details result in Figure 4. The result in Figure5 is an important proof that as the NiO thin films is deposited on the TZO thin films with the (002) and (004) diffraction peaks, the crystalline structure of the NiO thin films will be controlled by TZO thin films. For that, the main diffraction peak is changed from the (200) plane to the (111) plane, and then the TZO thin films will dominate the crystalline structure (Figure 1a). Figure 5 also shows that both the diffraction intensity ratio of 2θ TZO(002)/2θ NiO(111) and the diffraction intensity of the TZO thin films increased with increasing deposition power.