Appl Phys Lett #www.selleckchem.com/products/XL880(GSK1363089,EXEL-2880).html randurls[1|1|,|CHEM1|]# 2008, 92:121915.CrossRef 7. Himcinschi C, Vrejoiu I, Friedrich M, Ding L, Cobet C, Esser N, Alexe M, Zahn RT: Optical characterisation of BiFeO 3 epitaxial thin films grown by pulsed-laser deposition. Phys Status Solidi C 2010, 7:296–299.CrossRef 8. Basu SR, Martin LW, Chu YH, Gajek M, Ramesh R, Rai RC, Xu X, Musfeldt JL: Photoconductivity in BiFeO 3 thin films. Appl Phys Lett 2008, 92:091905.CrossRef 9. Xu XS, Brinzari TV, Lee S, Chu YH, Martin LW, Kumar A, McGill S,
Rai RC, Ramesh R, Gopalan V, Cheong SW, Musfeldt JL: Optical properties and magnetochromism in multiferroic BiFeO 3 . Phys Rev B 2009, 79:134425.CrossRef 10. Liu X, Liu Y, Chen W, Li J, Liao L: Ferroelectric memory based on nanostructures. Nanoscale Res Lett 2012, 7:285.CrossRef 11. Chu YH, Zhan Q, Martin LW, Cruz MP, Yang PL, Pabst GW, Zavaliche F, Yang SY, Zhang JX, Chen LQ, Schlom DG, Lin IN, Wu TB, Ramesh R: Nanoscale domain control in multiferroic BiFeO 3 thin films. Adv Mater 2006, 18:2307–2311.CrossRef 12. Losurdo M, Bergmair M, Bruno G, Cattelan D, Cobet C, de Martino A, Fleischer K, Dohcevic-Mitrovic Z, Esser N, Galliet M, Gajic R, Hemzal D, Hingerl K, Humlicek J, Ossikovski R, Popovic ZV, Saxl O: Spectroscopic ellipsometry and polarimetry for materials and systems analysis at the nanometer scale:
state-of-the-art, potential, and perspectives. J Nanopart Res 2009, 11:1521–1554.CrossRef 13. Xia GQ, Zhang RJ, Chen YL, Zhao HB, Wang SY, Zhou SM, Zheng YX, Yang YM, Chen LY, Chu JH, Wang ZM: New design LY2874455 cell line of the variable angle infrared spectroscopic ellipsometer using double Fourier transforms. Rev Sci Instrum 2000, 71:2677–2683.CrossRef 14. Zhang RJ, Chen YM, Lu WJ, Cai QY, Zheng YX, Chen LY: Influence of nanocrystal size on dielectric functions of Si nanocrystals embedded in SiO 2 matrix. Appl Phys Lett 2009, 95:161109.CrossRef 15. Zhao M, second Zhang RJ, Gu HS, Chen MN: Preparation of (Ba 0.5 Sr 0.5 ) TiO 3 thin film by Sol–gel technique and its characteristics. J Infrared Millim Waves
2001, 20:73–76. 16. Zhao M, Zhang RJ, Gu HS, Xu JP: (Ba 0.5 Sr 0.5 ) TiO 3 thin film’s preparation and its electric characteristics. J Infrared Millim Waves 2003, 22:71–74. 17. Chen YM, Zhang RJ, Zheng YX, Mao PH, Lu WJ, Chen LY: Study of the optical properties of Bi 3.15 Nd 0.85 Ti 3 O 12 ferroelectric thin films. J Korean Phys Soc 2008, 53:2299–2302.CrossRef 18. Zhang F, Zhang RJ, Zhang DX, Wang ZY, Xu JP, Zheng YX, Chen LY, Huang RZ, Sun Y, Chen X, Meng XJ, Dai N: Temperature-dependent optical properties of titanium oxide thin films studied by spectroscopic ellipsometry. Appl Phys Express 2013, 6:121101.CrossRef 19. Chen ZH, He L, Zhang F, Jiang J, Meng JW, Zhao BY, Jiang AQ: The conduction mechanism of large on/off ferroelectric diode currents in epitaxial (111) BiFeO 3 thin film. J Appl Phys 2013, 113:184106.CrossRef 20. Fujiwara H: Data analysis. In Spectroscopic Ellipsometry: Principles and Applications.