K-NC (Kuan-Neng Chen) is a professor of the Department of Electronics Engineering in National Chiao Tung University (National Chiao Tung University), Hsinchu, Taiwan. He received his Ph.D. degree in Electrical Engineering and Computer Science and
his M.S. degree in Materials Science and Engineering from Massachusetts Institute of Technology (MIT), respectively. Prior to the faculty position, he was a research staff member and project leader at the IBM Thomas J. Watson NU7026 concentration Research Center. His www.selleckchem.com/products/jq-ez-05-jqez5.html current research interests are three-dimensional integrated circuits (3D IC), through-silicon via (TSV) technology, wafer bonding technology, and heterogeneous integration. H-CC (Huang-Chung Cheng) is a professor of the Department see more of Electronics Engineering in National Chiao Tung University (National Chiao
Tung University), Hsinchu, Taiwan. He received the B.S. degree in physics from National Taiwan University in 1977 and the M.S. and Ph.D. degrees from the Department of Materials Science and Engineering, National Tsing Hua University (National Tsing Hua University), Hsinchu, Taiwan, in 1979 and 1985, respectively. He has published nearly 500 technical papers in international journals and conferences and also held more than 50 patents. His current research interests are in the areas of high-performance TFTs, novel nanowire devices, non-volatile memories, three-dimensional integrations, novel field emission displays, biosensors, and photoelectronic device. Acknowledgments The authors thank the National Science Council of the Republic of China for their support under the Contract NSC 101-2221-E-009-077-MY3. Thanks are also due to the Nano Facility Center (NFC) in National Chiao Tung University for the technical supports. References Unoprostone 1. Dalton B, Collins S, Munoz E, Razal JM, Ebron VH, Ferraris JP, Coleman JN, Kim BG, Baughman RH: Super-tough carbon-nanotube fibres. Nature 2003, 423:703. 10.1038/423703aCrossRef 2. Wei BQ, Vajtai R, Ajayan PM: Reliability and current carrying capacity of carbon nanotubes. Appl Phys Lett 2001, 79:1172. 10.1063/1.1396632CrossRef 3. Li WZ, Xie SS, Qian
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